Located in Fuyang Industrial Square, Xiangcheng District Economic Development Zone, Suzhou SiScan Technology Co., Ltd. was established in Suzhou on June 16, 2021. We are focused on electron beam (E-beam) imaging technologies, providing full aspect solutions for patterned wafer metrology and inspection. Gathering talents and industry specialists at home and from abroad, SiScan adheres to the entrepreneurial philosophy of pioneering, innovation, hard work and win-win solution, with core business focuses on the R&D, production, and services of E-beam metrology and inspection equipment for semiconductor wafer fabrication. Additionally, we are committed to the accumulation of independent intellectual property and technical knowledge in this field at an internationally advanced level in order to provide first-class solutions for high-end semiconductor processes and strive to remove bottlenecks in the localization of semiconductor manufacturing equipment.
SiScan Technology Co. Ltd. will continue to track the latest international technology trends and market demand, and lose no time in the electronic optics core technology, AI-based defect classification, design database applications and other fields to invest in research and development, and continue to expand product categories and series.